DocumentCode
3078249
Title
Growth of LiNbO3 thin films by bias sputtering
Author
Nishida, T. ; Masuda, Y. ; Shiosaki, T.
Author_Institution
Dept. of Electr. Eng., Hachinohe Inst. of Technol., Japan
fYear
1998
fDate
1998
Firstpage
321
Lastpage
324
Abstract
Interest in the use of LiNbO3 thin films for piezoelectric and optical applications has increased. However it has been very difficult to prepare high-quality LiNbO3 films. In order to improve the quality, LiNbO3 films were prepared by bias sputtering, and the effects of bias electric field during the LiNbO 3 sputtering deposition were investigated. The deposition rate and Li/Nb composition of obtained films were greatly influenced by the bias field applied externally. The relationship between the bias voltage, the deposition rate and the composition was evaluated, revealing that both the rate and Li composition of the films were decreased at negative bias voltage. The oriented LiNbO3 films on SiO2/Si substrates may show fine piezoelectric and electric properties. However it has been very hard to grow oriented LiNbO3 films on SiO2. C-axis oriented LiNbO3 films were successfully obtained on SiO2/Si by bias sputtering. The as-grown oriented films also showed pyroelectricity. It was revealed that bias sputtering was very useful in the improvement of the crystallinity of LiNbO3 films
Keywords
lithium compounds; piezoelectric thin films; pyroelectricity; sputter deposition; LiNbO3; Si; SiO2; SiO2/Si substrates; bias electric field; bias sputtering; bias voltage; c-axis oriented films; crystallinity; deposition rate; piezoelectric properties; pyroelectricity; thin films; Crystallization; Materials science and technology; Niobium; Optical films; Piezoelectric films; Polarization; Semiconductor films; Sputtering; Substrates; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 1998. ISAF 98. Proceedings of the Eleventh IEEE International Symposium on
Conference_Location
Montreux
ISSN
1099-4734
Print_ISBN
0-7803-4959-8
Type
conf
DOI
10.1109/ISAF.1998.786698
Filename
786698
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