• DocumentCode
    3078259
  • Title

    A new network element for performance monitoring and test access spanning the digital hierarchy

  • Author

    Cadieux, Kevin ; Engdahl, Thomas ; Hartmann, Paul ; Pope, Kevin

  • Author_Institution
    Appl. Digital Access, San Diego, CA, USA
  • fYear
    1990
  • fDate
    16-19 Apr 1990
  • Firstpage
    1319
  • Abstract
    A description is given of an integrated transport access unit (ITAU) that interfaces to the network at the DS3 rate and combines the capabilities of a conventional digital test access unit with those of an embedded monitoring unit that spans the digital hierarchy. The ITAU provides a remote gateway to an operations support system (OSS), facilitating the isolation and elimination of error conditions in the network. Since the ITAU is an in-line network element, it must maintain maximum transparency while performing tests on embedded channels in a hitless fashion so that all other channels pass through unaffected. Continuous performance monitoring at all levels of the hierarchy, combined with individual channel test access, allows the ITAU to act as a diagnostic pickup point in the network. Multiple ITAUs positioned throughout the network and connected through the OSS allow network faults to be detected and isolated quickly
  • Keywords
    computer networks; computerised monitoring; digital communication systems; fault location; hierarchical systems; network operating systems; diagnostic pickup point; digital hierarchy; in-line network element; integrated transport access unit; network faults; operations support system; performance monitoring; remote gateway; tests on embedded channels; transparency; Automatic testing; Centralized control; Control systems; Performance evaluation; Process control; Remote monitoring; Routing; SONET; System testing; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 1990. ICC '90, Including Supercomm Technical Sessions. SUPERCOMM/ICC '90. Conference Record., IEEE International Conference on
  • Conference_Location
    Atlanta, GA
  • Type

    conf

  • DOI
    10.1109/ICC.1990.117283
  • Filename
    117283