• DocumentCode
    3078266
  • Title

    Software and hardware quality assurance: towards a common platform for high reliability

  • Author

    Martin, R. ; Mathur, Aditya

  • Author_Institution
    Software Eng. Res. Center, Purdue Univ., West Lafayette, IN, USA
  • fYear
    1990
  • fDate
    16-19 Apr 1990
  • Firstpage
    1324
  • Abstract
    The authors point out the conceptual similarity between two quality assurance technologies emerging independently in the worlds of software and hardware. They outline the advantages of these technologies over competing ones and then argue how, by exploiting this similarity and the emerging parallel processing technology, a common platform of integratable tools can be built to perform cost-effective hardware and software testing for complex products of the future. Both techniques use fault modeling for showing the presence of faults in the objects of interest, namely, the program and the circuit. However, the test generation method used in mutation-based testing appears more general than the one used for hardware testing when their functional details are examined. As most useful hardware consists of sequential circuits with memory, the test data generation method used in software testing seems worthy of examination for hardware test vector generation also
  • Keywords
    computer testing; parallel processing; program testing; quality control; reliability; fault modelling; hardware test vector generation; integratable tools; mutation-based testing; parallel processing; quality assurance technologies; sequential circuits with memory; software testing; Circuit faults; Circuit testing; Hardware; Parallel processing; Performance evaluation; Quality assurance; Sequential analysis; Sequential circuits; Software quality; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 1990. ICC '90, Including Supercomm Technical Sessions. SUPERCOMM/ICC '90. Conference Record., IEEE International Conference on
  • Conference_Location
    Atlanta, GA
  • Type

    conf

  • DOI
    10.1109/ICC.1990.117284
  • Filename
    117284