DocumentCode :
3078460
Title :
Intensity modulation effect on second harmonic profile of methane detection using wavelength modulation spectroscopy
Author :
Shemshad, J.
Author_Institution :
Fac. of Eng., Univ. of Queensland, Brisbane, QLD, Australia
fYear :
2012
fDate :
2-6 July 2012
Firstpage :
588
Lastpage :
589
Abstract :
The effect of intensity modulation (IM) of a tunable diode laser (TDL) on the wavelength modulation spectroscopy (WMS) and second harmonic (2f) lineshape profile of methane near 1666nm is experimentally investigated. The results are quantified and shown as a function of modulation depth.
Keywords :
gas sensors; intensity modulation; measurement by laser beam; modulation spectroscopy; semiconductor lasers; intensity modulation effect; methane detection; second harmonic lineshape profile; tunable diode laser; wavelength 1666 nm; wavelength modulation spectroscopy; Gas lasers; Intensity modulation; Laser modes; Measurement by laser beam; Semiconductor lasers; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Opto-Electronics and Communications Conference (OECC), 2012 17th
Conference_Location :
Busan
ISSN :
2166-8884
Print_ISBN :
978-1-4673-0976-9
Electronic_ISBN :
2166-8884
Type :
conf
DOI :
10.1109/OECC.2012.6276585
Filename :
6276585
Link To Document :
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