TEM investigation of rhombohedral PZT thin films

Author

Ricote, J. ; Zhang, Qi ; Whatmore, R.W.

Author_Institution

Adv. Mater. Dept., Cranfield Inst. of Technol., Bedford, UK

fYear

1998

fDate

1998

Firstpage

483

Lastpage

486

Abstract

This work analyses thin films of compositions within the rhombohedral phase of the lead zirconate titanate (PZT) system, and compares the results with previous reports on the structure and physical properties carried out on the same materials, but in the ceramic form. Irrespective of the special characteristics of thin films, the same structural features as in the ceramics were observed. This shows that the origin of the superlattice reflections is not related to a particular characteristic of the ceramic form, but to a fundamental aspect of the crystal structure. The influence of the domain configuration on the physical behaviour is also discussed and compared to the ceramic case

Keywords

crystal structure; electric domains; ferroelectric materials; ferroelectric thin films; lead compounds; transmission electron microscopy; PZT; PbZrO3TiO3; TEM; ceramics; crystal structure; domain configuration; physical properties; rhombohedral PZT thin films; structure; Ceramics; Composite materials; Crystallization; Electrons; Ferroelectric materials; Polarization; Reflection; Superlattices; Titanium compounds; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 1998. ISAF 98. Proceedings of the Eleventh IEEE International Symposium on

Conference_Location

Montreux

ISSN

1099-4734

Print_ISBN

0-7803-4959-8

Type

conf

DOI

10.1109/ISAF.1998.786737

Filename

786737