DocumentCode :
3078906
Title :
Using 4KB page size for Virtual Memory is obsolete
Author :
Weisberg, P. ; Wiseman, Y.
Author_Institution :
Dept. of Comput. Sci., Bar Ilan Univ., Israel
fYear :
2009
fDate :
10-12 Aug. 2009
Firstpage :
262
Lastpage :
265
Abstract :
A 4 KB page size has been used for Virtual Memory since the sixties. In fact, today, the most common page size is still 4 KB. Choosing a page size is finding the middle ground between several factors. On the one hand, a smaller page will reduce fragmentation; thus saving memory space. On the other hand, a larger page will increase TLB coverage; thus eliminating the need to access memory resident page tables. During the years that the 4 KB page has been employed, memory size has increased from Megabytes to Gigabytes. We can sacrifice some space for higher performance. With the aim of obtaining the optimal page size, we simulated applications from the SPEC2000 suite. We measured TLB misses and memory usage of all page sizes that are powers of two, ranging from 4 KB to 256 KB. Based on our results, we show that the use of 16 KB size for the base page is the recommended selection. Another way of increasing page size and TLB coverage is using superpages. Many machines support several page sizes, which let the OS use several page sizes. In this paper we survey various ways of making the most of superpages. We adopt a simple solution of superpaging with two page sizes. Based on our results, we suggest a base page of 16 KB for code or small data segments and a larger page of 256 KB for large data segments.
Keywords :
operating systems (computers); paged storage; TLB misses; operating system; optimal page size; storage capacity 4 Kbit; virtual memory; Central Processing Unit; Computer science; Data structures; Hardware; Kernel; Linux; Memory management; Size measurement; Throughput; Allocation/deallocation strategies; Main memory; Simulation; Virtual memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Reuse & Integration, 2009. IRI '09. IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-4114-3
Electronic_ISBN :
978-1-4244-4116-7
Type :
conf
DOI :
10.1109/IRI.2009.5211562
Filename :
5211562
Link To Document :
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