Title :
Empirical design bugs prediction for verification
Author :
Guo, Qi ; Chen, Tianshi ; Shen, Haihua ; Chen, Yunji ; Wu, Yue ; Hu, Weiwu
Author_Institution :
Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
Abstract :
Coverage model is the main technique to evaluate the thoroughness of dynamic verification of a Design-under-Verification (DUV). However, rather than achieving a high coverage, the essential purpose of verification is to expose as many bugs as possible. In this paper, we propose a novel verification methodology that leverages the early bug prediction of a DUV to guide and assess related verification process. To be specific, this methodology utilizes predictive models built upon artificial neural networks (ANNs), which is capable of modeling the relationship between the high-level attributes of a design and its associated bug information. To evaluate the performance of constructed predictive model, we conduct experiments on some open source projects. Moreover, we demonstrate the usability and effectiveness of our proposed methodology via elaborating experiences from our industrial practices. Finally, discussions on the application of our methodology are presented.
Keywords :
formal verification; logic design; neural nets; ANN; artificial neural networks; coverage model; design bugs prediction; design-under-verification; Complexity theory; Computer bugs; Correlation; Measurement; Predictive models; Training; Training data; Bug Prediction; Complexity Metric; Empirical Study; Verification;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
Print_ISBN :
978-1-61284-208-0
DOI :
10.1109/DATE.2011.5763036