Title :
Particle swarm optimization and covariance matrix based data imputation
Author :
Krishna, Mridul ; Ravi, Vignesh
Author_Institution :
Center of Excellence in CRM & Analytics, Masab Tank, Hyderabad, India
Abstract :
We propose a data imputation method based on Particle Swarm Optimization (PSO) and covariance matrix of the data. PSO is used to minimize the following error functions in a nested form (i) Mean squared error between the covariance matrix of the set of complete records and the covariance matrix of the set of total records including imputed ones. (ii) Absolute difference between the determinants of the two covariance matrices. The algorithm is designed to stop only when these two errors become very small across two consecutive iterations. The proposed method was tested on several regression, classification and banking datasets using 10 fold cross validation. The quality of the imputation is tested by using Mean Absolute Percentage Error (MAPE) value. We compared the results of the proposed method with that of a hybrid data imputation method based on K-means and Multi-layer Perceptron (MLP). We observed that while the the proposed preserves the covariance structure of the data, it achieved better imputation in most of the datasets as evidenced by the Wilcoxon signed rank test to test the statistical significance of the results.
Keywords :
covariance matrices; mean square error methods; multilayer perceptrons; particle swarm optimisation; pattern classification; regression analysis; MAPE value; MLP; PSO; banking datasets; classification; covariance matrix; data imputation; error functions; mean absolute percentage error; mean squared error; multilayer perceptron; particle swarm optimization; regression; Algorithm design and analysis; Banking; Covariance matrices; Genetic algorithms; Iris; Neural networks; Vectors; Covariance Matrix; K-means; Multi Layer Perceptron; ParticleSwarm Optimization (PSO); Wilcoxon signed rank test;
Conference_Titel :
Computational Intelligence and Computing Research (ICCIC), 2013 IEEE International Conference on
Conference_Location :
Enathi
Print_ISBN :
978-1-4799-1594-1
DOI :
10.1109/ICCIC.2013.6724232