DocumentCode :
3079625
Title :
A 1 mm 50 K-pixel IT CCD image sensor for miniature camera system
Author :
Itakura, K. ; Nobusada, T. ; Kokusenya, N. ; Nagayoshi, R. ; Ozaki, M.
Author_Institution :
Electron. Res. Lab., Matsushita Electron. Corp., Osaka, Japan
fYear :
1998
fDate :
5-7 Feb. 1998
Firstpage :
180
Lastpage :
181
Abstract :
A 1 mm 50 k-pixel interline CCD features a 4/spl times/4 /spl mu/m/sup 2/ pixel, integration of a Vsub adjust circuit and a packageless assembly of a chip-provided microlens. The chip size and the assembled device outer sizes are 1.1 (H)/spl times/1.34 (V)mm/sup 2/ and 1.2 (H)/spl times/1.5 (V)mm/sup 2/ respectively. The 4/spl times/4 /spl mu/m/sup 2/-Pixel has image quality equivalent to that of conventional 5/spl times/5 /spl mu/m/sup 2/ pixel. Channel narrowing is important in design with small pixel size, because narrowed channel causes reduction of handling charge in the vertical CCD. A low-temperature oxidation process minimizes channel narrowing caused by lateral diffusion of boron. The thickness of the transfer gate oxide is reduced to 80%, which also results in an increase of handling charge. Tne creation of the p-well and n-type region of the photodiode (PD) are by high-energy ion implantation, making the isolation length between VCCD and PD shorter than that with the conventional method. Owing to the above techniques, VCCD with 0.8pm channel width has 2.0/spl times/10/sup 4/ electron/pixel handling charge.
Keywords :
CCD image sensors; 1 mm; 50 kpixel; IT CCD image sensor; assembled device outer sizes; channel narrowing; chip size; chip-provided microlens; electron/pixel handling charge; handling charge; high-energy ion implantation; image quality; isolation length; low-temperature oxidation process; miniature camera system; n-type region; p-well region; packageless assembly; vertical CCD; Assembly; Charge coupled devices; Charge-coupled image sensors; Circuits; Image quality; Lenses; Microoptics; Oxidation; Packaging; Pixel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1998. Digest of Technical Papers. 1998 IEEE International
Conference_Location :
San Francisco, CA, USA
ISSN :
0193-6530
Print_ISBN :
0-7803-4344-1
Type :
conf
DOI :
10.1109/ISSCC.1998.672426
Filename :
672426
Link To Document :
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