Title :
A new architecture for power network in 3D IC
Author :
Chen, Hsien-Te ; Lin, Hong-Long ; Wang, Zi-Cheng ; Hwang, TingTing
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Providing high vertical interconnection density between device tiers, through silicon via (TSV) offers a promising solution in 3D IC to reduce the length of global interconnection. However, some design issues hinder TSV from volumes of adoption, such as IR drop, thermal dissipation, current delivery per package pin and various voltage domains among tiers. To tackle these problems, the design of power network plays an important role in 3D IC. A new integrated architecture of stacked-TSV and power distributed network (STDN) is proposed in this paper. Our new STDN serves triple roles: power network to deliver larger current and reduce IR drop, thermal network to reduce temperature, and decoupling capacitor network to reduce power noise. As well, it helps to alleviate the limitation of the number of IO power pins. For both single and multiple power domains, the proposed STDN architecture demonstrates good performance in 3D floorplan, IR drop, power noise, temperature, area and even the total length of signal connections for selected MCNC benchmarks.
Keywords :
integrated circuit layout; integrated circuit noise; three-dimensional integrated circuits; 3D IC; 3D floorplan; IO power pins; IR drop; TSV; current delivery per package pin; decoupling capacitor network; multiple power domains; power distributed network; power network; power noise; single power domains; thermal dissipation; through silicon via; Metals; Noise; Three dimensional displays; Through-silicon vias; Transient analysis; Wire;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
Print_ISBN :
978-1-61284-208-0
DOI :
10.1109/DATE.2011.5763070