Title :
Spare cutting approaches for repairing memories
Author :
Shen, Y.-N. ; Park, N. ; Lombardi, E.
Author_Institution :
Actel Corp., Sunnyvale, CA, USA
Abstract :
This paper presents new algorithms for yield enhancement of redundant memories. These algorithms are based on the technique of spare cutting for a redundant memory chip in which repair is implemented by row/column deletion. Different approaches are proposed: some of these approaches are based on a fully exhaustive process, while others try to heuristically reduce the computational overhead involved in determining the repair-solution
Keywords :
circuit optimisation; computational complexity; integrated circuit yield; memory architecture; random-access storage; computational overhead; fully exhaustive process; memories repair; redundant memories; repair-solution; row/column deletion; spare cutting approaches; yield enhancement; Laser beam cutting; Laser theory; Manufacturing; NP-complete problem; Production; Random access memory; Read-write memory; Redundancy; Testing; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1996. ICCD '96. Proceedings., 1996 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-7554-3
DOI :
10.1109/ICCD.1996.563541
