Title :
High-performance Ge photoreceivers operating in the wavelength range of 850 nm∼1550 nm
Author :
Jang, Ki-Seok ; Kim, Sanghoon ; Kim, In Gyoo ; Joo, Jiho ; Kim, Gyungock
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
We present high-performance photoreceivers based on vertical-illumination-type 100% Ge-on-Si p-i-n photo-detectors (PDs) operating at λ ~1550 nm and at λ ~850 nm. The TO-can packaged photoreceivers with Ge PDs optimized for λ ~1550 nm and data rates of 2.5 Gbps and 10 Gbps exhibit the sensitivities of -25.5 dBm and -9.5 dBm (bit error rate of 10-12), respectively. Also, the 10 Gbps photoreceiver with a Ge PD optimized for λ ~850 nm shows the sensitivity of -15.64 dBm. This experimental result indicates that the Ge photoreceiver based on silicon photonics technology can readily provide cost-effective solutions for optical network applications.
Keywords :
elemental semiconductors; error statistics; germanium; optical communication; optical receivers; p-i-n diodes; silicon; Ge; Si; bit error rate; bit rate 10 Gbit/s; bit rate 2.5 Gbit/s; cost-effective solutions; high-performance photoreceivers; optical network applications; p-i-n photodetectors; silicon photonics technology; vertical-illumination-type; wavelength 850 nm to 1550 nm; Data communication; Optical fiber networks; Optical sensors; Photodetectors; Semiconductor device measurement; Sensitivity; Silicon;
Conference_Titel :
Opto-Electronics and Communications Conference (OECC), 2012 17th
Conference_Location :
Busan
Print_ISBN :
978-1-4673-0976-9
Electronic_ISBN :
2166-8884
DOI :
10.1109/OECC.2012.6276651