• DocumentCode
    3079878
  • Title

    Variation aware dynamic power management for chip multiprocessor architectures

  • Author

    Ghasemazar, Mohammad ; Pedram, Massoud

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    With the increasing levels of variability in the characteristics of VLSI circuits and continued uncertainty in the operating conditions of processors, achieving predictable power efficiency and high performance in the electronic systems has become a daunting, yet vital, task. This paper tackles the problem of system-level dynamic power management (DPM) in the state-of-the-art chip multiprocessor (CMP) architectures that are manufactured in nanoscale CMOS technologies with large process variations or are operated under widely varying environmental conditions over their lifetime. We adopt a Markovian Decision Process based approach to CMP power management problem. The proposed technique models the underlying variability and uncertainty of parameters in system level as a partially observable MDP, and finds the optimal policy that stochastically minimizes energy per request. Experimental results demonstrate the high efficacy of the proposed power management framework.
  • Keywords
    CMOS digital integrated circuits; Markov processes; VLSI; microprocessor chips; multiprocessing systems; nanoelectronics; power aware computing; CMP power management problem; VLSI circuit; chip multiprocessor architecture; nanoscale CMOS technology; partially observable Markovian decision process; system-level dynamic power management; variation aware dynamic power management; Cost function; Hidden Markov models; Markov processes; Power demand; Program processors; Uncertainty; Chip multiprocessor; Dynamic power management; partially observable Markovian decision process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763082
  • Filename
    5763082