• DocumentCode
    3079928
  • Title

    Pulse shortening in high power microwave sources

  • Author

    Benford, J. ; Benford, G.

  • Author_Institution
    Physics Int. Co., San Leandro, CA, USA
  • fYear
    1996
  • fDate
    3-5 June 1996
  • Firstpage
    230
  • Abstract
    Summary form only given. We review the current state of understanding of the universal phenomena that high power microwave pulses are shorter than the applied electrical pulse. Higher power reduces pulse duration, limiting present-day sources to a few hundred joules. Is this limitation fundamental, or are there means to avoid it entirely? There is no reason to think that only one mechanism is responsible. Rather, there are layers of effects which may need to be addressed separately. We categorize experimental observations in terms of candidate pulse shortening mechanisms such as gap closure, primary and secondary electron bombardment of walls, and RF breakdown. Pulse shortening mechanism theory (microwave field interaction with the beam, resistive filamentation, enhanced closure, etc.) is summarized and compared to observations. We make suggestions for additional experiments and diagnostics to help separate out causes. Finally, means of reducing or eliminating pulse shortening are reviewed.
  • Keywords
    microwave generation; RF breakdown; applied electrical pulse; diagnostics; enhanced closure; gap closure; high power microwave sources; microwave field interaction; primary electron bombardment; pulse duration; pulse shortening; pulse shortening mechanisms; resistive filamentation; secondary electron bombardment; Electric breakdown; Electron beams; Geometry; Magnetic field measurement; Microwave devices; Microwave oscillators; Physics; Plasma measurements; Space vector pulse width modulation; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-3322-5
  • Type

    conf

  • DOI
    10.1109/PLASMA.1996.551437
  • Filename
    551437