• DocumentCode
    3080186
  • Title

    A novel sparse source imaging in reconstructing extended cortical current sources

  • Author

    Ding, Lei

  • Author_Institution
    University of Oklahoma, Norman, USA
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    4555
  • Lastpage
    4558
  • Abstract
    We have developed a new sparse source imaging (SSI) method with the use of the L1-norm in EEG inverse problems to reconstruct extended cortical current sources. The new SSI method explores the sparseness in cortical current density variation maps (the transform domain) other than in the cortical current density maps (the original domain) from previously reported SSI methods. The new SSI is assessed by a series of computer simulations. The performance of SSI is compared with the well-known L2-norm MNE using the AUC metric. Our present simulation data indicate that the new SSI has significantly improved performance in reconstructing extended cortical current sources and estimating their cortical extents. The L2-norm MNE shows relatively poor performance in the same source imaging tasks. The new SSI method is also applicable to MEG source imaging.
  • Keywords
    Brain modeling; Charge coupled devices; Computer simulation; Current density; Current distribution; Current measurement; Electroencephalography; Image reconstruction; Inverse problems; Surface reconstruction; EEG; L1-norm; SCOP; sparse source imaging; sparseness regularization; transform domain; Action Potentials; Algorithms; Area Under Curve; Brain; Brain Mapping; Cerebral Cortex; Computer Simulation; Electroencephalography; Electrophysiology; Humans; Image Processing, Computer-Assisted; Magnetic Resonance Imaging; Neurons; ROC Curve; Sensitivity and Specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4650226
  • Filename
    4650226