DocumentCode :
3080210
Title :
Low power interconnects for SIMD computers
Author :
Woh, Mark ; Satpathy, Sudhir ; Dreslinski, Ronald G. ; Kershaw, Danny ; Sylvester, Dennis ; Blaauw, David ; Mudge, Trevor
Author_Institution :
ACAL, Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2011
fDate :
14-18 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
Driven by continued scaling of Moore´s Law, the number of processing elements on a die are increasing dramatically. Recently there has been a surge of wide single instruction multiple data architectures designed to handle computationally intensive applications like 3D graphics, high definition video, image processing, and wireless communication. A limit of the SIMD width of these types of architectures is the scalability of the interconnect network between the processing elements in terms of both area and power. To mitigate this problem, we propose the use of a new interconnect topology, XRAM, which is a low power high performance matrix style crossbar. It re-uses output buses for control programming, and stores multiple swizzle configurations at the cross points using SRAM cells, significantly reducing routing congestion and control signaling. We show that compared to conventionally implemented crossbars, the area scales with the product of inputx output ports while consuming almost 50% less energy. We present an application case study, color-space conversion, utilizing XRAM and show a 1.4× gain in performance while consuming 1.5-2.5× less power.
Keywords :
multiprocessor interconnection networks; parallel processing; random-access storage; 3D graphics; Moore´s law; SIMD computers; SRAM cells; XRAM; computationally intensive applications; control programming; control signaling; high definition video; image processing; interconnect network; interconnect topology; low power interconnects; multiple swizzle configurations; routing congestion; single instruction multiple data architectures; wireless communication; Computer architecture; Integrated circuit interconnections; Pixel; Program processors; Programming; Random access memory; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
ISSN :
1530-1591
Print_ISBN :
978-1-61284-208-0
Type :
conf
DOI :
10.1109/DATE.2011.5763098
Filename :
5763098
Link To Document :
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