Ramp calibration of temperature sensors

This paper describes a new approach to the calibration of temperature sensors. The traditional approach, in which the output of a device-under-test (DUT) and that of a reference sensor are compared at a few temperatures, is time consuming and, therefore, significantly increases production costs. The proposed method, in which a temperature ramp is applied to the DUT, is much faster and therefore lower cost. Moreover, unlike the conventional approach, in which calibration data is only obtained at a few temperatures, the proposed approach facilitates the characterization of the DUT over its full operating range.