DocumentCode :
3080696
Title :
EOG artifact minimization using oblique projection corrected eigenvector decomposition
Author :
Zhou, Ziling ; Puthusserypady, Sadasivan
Author_Institution :
Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576, Singapore
fYear :
2008
fDate :
20-25 Aug. 2008
Firstpage :
4656
Lastpage :
4659
Abstract :
In this paper, the authors propose an efficient algorithm to minimize the electrooculogram (EOG) artifacts in electroencephalogram (EEG). The approach uses the eigenvectors obtained from a learning process to initialize an oblique projection based blind source extraction (BSE) algorithm. It is used to extract the point source EOG artifacts. EEG data is subsequently reconstructed by a deflation method. The simulations with synthetic data illustrate that the BSE corrected algorithm is reliable and has better performance than the uncorrected eigenvector decomposition based method. The results of simulations with real EEG data confirms the effectiveness of our algorithm.
Keywords :
Bioelectric phenomena; Brain modeling; Chromium; Covariance matrix; Data mining; Electrodes; Electroencephalography; Electrooculography; Independent component analysis; Minimization methods; Algorithms; Artifacts; Brain; Computer Simulation; Electroencephalography; Electrooculography; Humans; Models, Biological; Models, Statistical; Monte Carlo Method; Neurons; Reproducibility of Results; Signal Processing, Computer-Assisted; Time Factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location :
Vancouver, BC
ISSN :
1557-170X
Print_ISBN :
978-1-4244-1814-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2008.4650251
Filename :
4650251
Link To Document :
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