DocumentCode :
3081009
Title :
Fabrication at wafer level of micromachined gas sensors based on Sno2 nanorods deposited by PECVD and gas sensing characteristics
Author :
Forleo, A. ; Francioso, L. ; Capone, S. ; Casino, F. ; Siciliano, P. ; Huang, H. ; Tan, O.K.
Author_Institution :
Ist. per la Microelettronica ed i Microsistemi, Consiglio Naz. delle Ric., Lecce, Italy
fYear :
2011
fDate :
28-29 June 2011
Firstpage :
196
Lastpage :
198
Abstract :
SnO2 nanorods were successfully deposited on 3" Si/SiO2 wafers by inductively coupled plasma-enhanced chemical vapor deposition (PECVD) and a wafer-level patterning of nanorods layer for miniaturized solid state gas sensor fabrication were performed. Uniform needle-shape SnO2 nanorods in situ grown were obtained under catalyst- and high temperature treatment-free growth condition. These nanorods have an average diameter between 5 and 15 nm and a length of 160 to 300 nm. The SnO2-nanords based gas sensors were tested towards NH3 and CH3OH and gas sensing tests show remarkable response, showing promising and repeatable results compared with the SnO2 thin films gas sensors.
Keywords :
chemical vapour deposition; gas sensors; microsensors; nanorods; silicon compounds; thin film sensors; wafer level packaging; PECVD; Si-SiO2; micromachined gas sensors; miniaturized solid state gas sensor fabrication; nanorod deposition; plasma-enhanced chemical vapor deposition; size 160 nm to 300 nm; thin films gas sensors; wafer-level patterning; Chemical sensors; Chemicals; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advances in Sensors and Interfaces (IWASI), 2011 4th IEEE International Workshop on
Conference_Location :
Savelletri di Fasano
Print_ISBN :
978-1-4577-0623-3
Electronic_ISBN :
978-1-4577-0622-6
Type :
conf
DOI :
10.1109/IWASI.2011.6004716
Filename :
6004716
Link To Document :
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