Title :
Design of voltage-scalable meta-functions for approximate computing
Author :
Mohapatra, Debabrata ; Chippa, Vinay K. ; Raghunathan, Anand ; Roy, Kaushik
Abstract :
Approximate computing techniques that exploit the inherent resilience in algorithms through mechanisms such as voltage over-scaling (VOS) have gained significant interest. In this work, we focus on meta-functions that represent computational kernels commonly found in application domains that demonstrate significant inherent resilience, namely Multimedia, Recognition and Data Mining. We propose design techniques (dynamic segmentation with multi-cycle error compensation, and delay budgeting for chained data path components) which enable the hardware implementations of these meta-functions to scale more gracefully under voltage over-scaling. The net effect of these design techniques is improved accuracy (fewer and smaller errors) under a wide range of over-scaled voltages. Results based on extensive transistor-level simulations demonstrate that the optimized meta-function implementations consume up to 30% less energy at iso-error rates, while achieving upto 27% lower error rates at iso-energy when compared to their baseline counterparts. System-level simulations for three applications, motion estimation, support vector machine based classification and k-means based clustering are also presented to demonstrate the impact of the improved meta-functions at the application level.
Keywords :
data mining; motion estimation; multimedia systems; pattern classification; pattern clustering; power aware computing; support vector machines; approximate computing; chained data path component; computational kernel; data mining; delay budgeting; dynamic segmentation; inherent resilience; k-means based clustering; motion estimation; multicycle error compensation; multimedia; optimized metafunction implementations; support vector machine based classification; system level simulations; transistor-level simulations; voltage over-scaling; Adders; Algorithm design and analysis; Clocks; Delay; Error compensation; Kernel; Radiation detectors; Approximate Computing; Low Power Design; Meta-functions; Voltage Over-scaling;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
Print_ISBN :
978-1-61284-208-0
DOI :
10.1109/DATE.2011.5763154