• DocumentCode
    3081808
  • Title

    Electrical characterization of GaN based blue light emitting diodes

  • Author

    Awaah, M.A. ; Nana, R. ; Das, K.

  • Author_Institution
    Dept. of Electr. Eng., Tuskegee Univ., AL, USA
  • fYear
    2005
  • fDate
    8-10 April 2005
  • Firstpage
    17
  • Lastpage
    22
  • Abstract
    Blue light emitting diodes (LEDs), based on an AlGaN/GaN/AlGaN double heterojunction structure, have been electrically characterized. These diodes are highly non-ideal with several approximately linear regimes in the semi-logarithmic plots of the forward characteristics. Calculated values of the ideality factor range from 3.0-7.0, indicating that the recombination process in these diodes cannot be conveniently described by the Shockley-Read-Hall statistics. Logarithmic plots of the forward characteristics indicate a space-charge-limited-current (SCLC) conduction through the active region of the diodes. Observed changes in the slope of these logarithmic plots are representative of a high density of "deep-level states" in the active region of the diodes. An analysis of these characteristics yielded an approximate density of deep-level states of 2×1017/cm3. These states are most likely located close to the valence band edge, in the compensated active region of the diodes.
  • Keywords
    III-V semiconductors; aluminium compounds; deep levels; electron-hole recombination; gallium compounds; light emitting diodes; semiconductor device measurement; space charge; valence bands; wide band gap semiconductors; AlGaN-GaN; LED characterization; SCLC conduction; blue light emitting diodes; characteristics approximately linear regimes; compensated active region; deep-level states high density; double heterojunction structure; forward characteristics semi-logarithmic plots; ideality factor; recombination process; space-charge-limited-current; valence band edge; Aluminum gallium nitride; Crystallization; Gallium nitride; III-V semiconductor materials; Light emitting diodes; Optical films; Photonic band gap; Substrates; Thermal conductivity; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoutheastCon, 2005. Proceedings. IEEE
  • Print_ISBN
    0-7803-8865-8
  • Type

    conf

  • DOI
    10.1109/SECON.2005.1423209
  • Filename
    1423209