DocumentCode :
3081895
Title :
High-temperature (>500°C) reconfigurable computing using silicon carbide NEMS switches
Author :
Wang, Xinmu ; Narasimhan, Seetharam ; Krishna, Aswin ; Wolff, Francis G. ; Rajgopal, Srihari ; Lee, Te-Hao ; Mehregany, Mehran ; Bhunia, Swarup
Author_Institution :
Electr. Eng. & Comput. Sci. Dept., Case Western Reserve Univ., Cleveland, OH, USA
fYear :
2011
fDate :
14-18 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
Many industrial systems, sensors and advanced propulsion systems demand electronics capable of functioning at high ambient temperature in the range of 500-600°C. Conventional Si-based electronics fail to work reliably at such high temperature ranges. In this paper we propose, for the first time, a high-temperature reconfigurable computing platform capable of operating at temperature of 500°C or higher. Such a platform is also amenable for reliable operation in high-radiation environment. The hardware reconfigurable platform follows the interleaved architecture of conventional Field Programmable Gate Array (FPGA) and provides the usual benefits of lower design cost and time. However, high-temperature operation is enabled by choice of a special device material, namely silicon carbide (SiC), and a special switch structure, namely Nano-Electro-Mechanical-System (NEMS) switch. While SiC provides excellent mechanical and chemical properties suitable for operation at extreme harsh environment, NEMS switch provides low-voltage operation, ultra-low leakage and radiation hardness. We propose a novel multi-layer NEMS switch structure and efficient design of each building block of FPGA using nanoscale SiC NEMS switches. Using measured switch parameters from a number of SiC NEMS switches we fabricated, we compare the power, performance and area of an all-mechanical FPGA with alternative implementations for several benchmark circuits.
Keywords :
field programmable gate arrays; nanoelectromechanical devices; semiconductor switches; silicon compounds; wide band gap semiconductors; FPGA; NEMS switch; SiC; field programmable gate array; hardware reconfigurable platform; high radiation environment; high temperature reconfigurable computing; interleaved architecture; nanoelectromechanical system switch; Field programmable gate arrays; Logic gates; Nanoelectromechanical systems; Routing; Silicon carbide; Structural beams; Temperature sensors; FPGA; High Temperature Electronics; NEMS; SiC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
ISSN :
1530-1591
Print_ISBN :
978-1-61284-208-0
Type :
conf
DOI :
10.1109/DATE.2011.5763175
Filename :
5763175
Link To Document :
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