Title :
Employing engineering methods for the analysis of OLEDs
Author :
Coelho, Isnaldo J S ; de Oliveira, Helinando P. ; Martins-Filho, Joaquim F. ; de Melo, Celso P.
Author_Institution :
Univ. Fed. do Vale do Sao Francisco, Brazil
Abstract :
We analyze typical static curves of organic light emitting diodes (OLEDs) that were obtained under mid-to-high biases, leading to forward currents ranging from contact-limited regime of injection to bulk-limited transport of majority carriers. We also present arguments to suggest that our OLEDs effectively behave as Schottky devices under static electric characterization. Two engineering methods, usually applied for inorganic Schottky diodes analysis, are shown to be also suitable for evaluation of OLEDs. As an alternative approach impedance spectroscopy measurements are employed to confirm that a Schottky-like type of behavior is adequate for modeling of OLEDs.
Keywords :
Schottky diodes; organic light emitting diodes; OLED; Schottky devices; impedance spectroscopy measurements; organic light emitting diodes; static electric characterization; Charge carrier processes; Data analysis; Data engineering; Electrochemical impedance spectroscopy; Impedance measurement; Indium tin oxide; Organic light emitting diodes; Polymer films; Schottky diodes; Tunneling;
Conference_Titel :
Microwave and Optoelectronics, 2005 SBMO/IEEE MTT-S International Conference on
Print_ISBN :
0-7803-9341-4
DOI :
10.1109/IMOC.2005.1580034