DocumentCode
3082071
Title
Employing engineering methods for the analysis of OLEDs
Author
Coelho, Isnaldo J S ; de Oliveira, Helinando P. ; Martins-Filho, Joaquim F. ; de Melo, Celso P.
Author_Institution
Univ. Fed. do Vale do Sao Francisco, Brazil
fYear
2005
fDate
25-28 July 2005
Firstpage
421
Lastpage
426
Abstract
We analyze typical static curves of organic light emitting diodes (OLEDs) that were obtained under mid-to-high biases, leading to forward currents ranging from contact-limited regime of injection to bulk-limited transport of majority carriers. We also present arguments to suggest that our OLEDs effectively behave as Schottky devices under static electric characterization. Two engineering methods, usually applied for inorganic Schottky diodes analysis, are shown to be also suitable for evaluation of OLEDs. As an alternative approach impedance spectroscopy measurements are employed to confirm that a Schottky-like type of behavior is adequate for modeling of OLEDs.
Keywords
Schottky diodes; organic light emitting diodes; OLED; Schottky devices; impedance spectroscopy measurements; organic light emitting diodes; static electric characterization; Charge carrier processes; Data analysis; Data engineering; Electrochemical impedance spectroscopy; Impedance measurement; Indium tin oxide; Organic light emitting diodes; Polymer films; Schottky diodes; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Optoelectronics, 2005 SBMO/IEEE MTT-S International Conference on
Print_ISBN
0-7803-9341-4
Type
conf
DOI
10.1109/IMOC.2005.1580034
Filename
1580034
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