• DocumentCode
    3082071
  • Title

    Employing engineering methods for the analysis of OLEDs

  • Author

    Coelho, Isnaldo J S ; de Oliveira, Helinando P. ; Martins-Filho, Joaquim F. ; de Melo, Celso P.

  • Author_Institution
    Univ. Fed. do Vale do Sao Francisco, Brazil
  • fYear
    2005
  • fDate
    25-28 July 2005
  • Firstpage
    421
  • Lastpage
    426
  • Abstract
    We analyze typical static curves of organic light emitting diodes (OLEDs) that were obtained under mid-to-high biases, leading to forward currents ranging from contact-limited regime of injection to bulk-limited transport of majority carriers. We also present arguments to suggest that our OLEDs effectively behave as Schottky devices under static electric characterization. Two engineering methods, usually applied for inorganic Schottky diodes analysis, are shown to be also suitable for evaluation of OLEDs. As an alternative approach impedance spectroscopy measurements are employed to confirm that a Schottky-like type of behavior is adequate for modeling of OLEDs.
  • Keywords
    Schottky diodes; organic light emitting diodes; OLED; Schottky devices; impedance spectroscopy measurements; organic light emitting diodes; static electric characterization; Charge carrier processes; Data analysis; Data engineering; Electrochemical impedance spectroscopy; Impedance measurement; Indium tin oxide; Organic light emitting diodes; Polymer films; Schottky diodes; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics, 2005 SBMO/IEEE MTT-S International Conference on
  • Print_ISBN
    0-7803-9341-4
  • Type

    conf

  • DOI
    10.1109/IMOC.2005.1580034
  • Filename
    1580034