• DocumentCode
    3082398
  • Title

    Suppression of anti-resonance peaks by controlling off-chip damping parameters

  • Author

    Iijima, Y. ; Sudo, Toshio ; Kinoshita, T. ; Uriu, Kazuhide

  • Author_Institution
    Shibaura Inst. of Technol., Tokyo, Japan
  • fYear
    2013
  • fDate
    12-15 Dec. 2013
  • Firstpage
    92
  • Lastpage
    95
  • Abstract
    Simultaneous switching noise (SSN) is a serious design issue to stabilize power supply integrity and logic operation in advanced CMOS circuits and systems. Furthermore, SSN causes electromagnetic interference (EMI). Ringing frequency observed in the SSN waveforms is strongly related to the anti-resonance peak frequency of the total PDN impedance. Therefore, suppressing the anti-resonance peak is currently one of the most important design concerns in VLSI systems. In this paper, the method which is called “on-board snubber circuits (RC series circuits)” has been studied to suppress the anti-resonance peak. The on-board snubber circuits was added just at the beneath of the power supply terminals of the LSI to effectively suppress the anti-resonance peak of the total PDN impedance. In particular, the design space for damping the anti-resonance peak critically and the added values of capacitance (Csnb) and resistance (Rdmp) of the snubber circuits has been examined.
  • Keywords
    CMOS integrated circuits; RC circuits; VLSI; electromagnetic interference; interference suppression; snubbers; EMI; LSI; RC series circuits; SSN waveforms; VLSI systems; advanced CMOS circuits; antiresonance peak frequency suppression; electromagnetic interference; logic operation; off-chip damping parameter control; on-board snubber circuits; power supply integrity stability; power supply terminals; ringing frequency; simultaneous switching noise; total PDN impedance; Capacitance; Capacitors; Damping; Impedance; Integrated circuit modeling; Power supplies; Snubbers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
  • Conference_Location
    Nara
  • Print_ISBN
    978-1-4799-2313-7
  • Type

    conf

  • DOI
    10.1109/EDAPS.2013.6724397
  • Filename
    6724397