• DocumentCode
    3082577
  • Title

    An enhanced empirical large signal model of SiC MESFETs for power applications

  • Author

    Sayed, Ahmed ; Boeck, Georg

  • Author_Institution
    Microwave Eng. Group, Technische Univ. Berlin, Germany
  • fYear
    2005
  • fDate
    25-28 July 2005
  • Firstpage
    28
  • Lastpage
    31
  • Abstract
    In this paper, a large signal table-based model for SiC MESFET is presented. A packaged commercially available high power MESFET device (CREE CRF24010) is adopted for the model development. The extracted bias-dependent elements of the small signal model as well as the measured DC data are mathematically described by small modification of Angelov´s formulation. Dispersion between DC and RF characteristics of the drain current is also observed and interpreted. The new model is capable to predict small signal as well as large signal performance accurately. A single stage ultra broadband 5 W power amplifier has been developed to verify the derived model. A good agreement has been obtained between simulated and measured results.
  • Keywords
    power MESFET; semiconductor device models; silicon compounds; wide band gap semiconductors; MESFET; SiC; drain current; power amplifier; power applications; Broadband amplifiers; Data mining; MESFETs; Mathematical model; Packaging; Power amplifiers; Predictive models; Radio frequency; Radiofrequency amplifiers; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics, 2005 SBMO/IEEE MTT-S International Conference on
  • Print_ISBN
    0-7803-9341-4
  • Type

    conf

  • DOI
    10.1109/IMOC.2005.1580056
  • Filename
    1580056