Title :
Near infrared spectroscopic characterization of metamaterials fabricated by focused ion beam milling
Author :
Kim, J. ; Lee, Y.U. ; Kang, Boyoung ; Woo, J.H. ; Choi, E. ; Kim, E.S. ; Gwon, M. ; Kim, D.-W. ; Wu, J.W.
Author_Institution :
Dept. of Phys., Ewha Womans Univ., Seoul, South Korea
Abstract :
Nano-scaled metamaterials are fabricated by a focused ion beam milling under the fine control of process factors. The meta-resonances are studied in NTR regime and they show the polarization-angle dependence coming from their meta-structures.
Keywords :
focused ion beam technology; infrared spectra; light polarisation; metamaterials; milling; nanofabrication; nanostructured materials; optical double resonance; NIR regime; focused ion beam milling; metaresonances; metastructures; nanoscaled metamaterials; near infrared spectroscopic properties; polarization-angle dependence;
Conference_Titel :
Opto-Electronics and Communications Conference (OECC), 2012 17th
Conference_Location :
Busan
Print_ISBN :
978-1-4673-0976-9
Electronic_ISBN :
2166-8884
DOI :
10.1109/OECC.2012.6276788
