DocumentCode :
3082819
Title :
A practical quality factor tuning scheme for IF and high-Q continuous-time filters
Author :
Stevenson, J.-M. ; Sanchez-Sinencio, E.
Author_Institution :
Dallas Semicond. Corp., Dallas, TX, USA
fYear :
1998
fDate :
5-7 Feb. 1998
Firstpage :
218
Lastpage :
219
Abstract :
An important aspect of reducing power and area of RF/IF systems is putting high-frequency filters on-chip instead of using off-chip crystal, ceramic, or SAW filters now used. The largest challenge facing designers is the vulnerability of high-frequency and high-Q continuous-time filters to parasitics and process variations, requiring automatic tuning of both center frequency and quality factor. Automatic center frequency tuning is well documented, with accuracies of <1% error. Q-tuning is not as well defined, with the best reported results at about 20-30% error. The Q-tuning method proposed here improves the accuracy of Q-tuning, with experimental Q-tuning error about 1%. The basis for the proposed method is the magnitude-locked-loop (MLL) Q-tuning technique. The scheme removes the peak detectors and utilizes the continuous-time adaptive LMS algorithm to update the biquad quality factor. As a test verification of the proposed Q-tuning scheme, a fourth order OTA-C 10.7 MHz bandpass filter is designed and fabricated in a 1.2 /spl mu/m n-well CMOS process. The filter consists of two cascaded biquads, each with a desired quality factor of 20 and the same center frequency. Center frequency tuning is provided by the conventional phase-locked loop using a voltage controlled oscillator scheme, and Q-tuning is by the proposed scheme. The reference signal for the Q-tuning circuit is simply the frequency control oscillator´s output.
Keywords :
Q-factor; 1.2 micron; 1.5 V; 10.7 MHz; 108 mW; IF filters; Q-tuning method; active filters; automatic tuning; biquad quality factor updating; cascaded biquads; center frequency tuning; continuous-time adaptive LMS algorithm; fourth order OTA-C bandpass filter; high-Q continuous-time filters; high-frequency filters; magnitude-locked-loop; n-well CMOS process; quality factor tuning scheme; Band pass filters; Ceramics; Detectors; Least squares approximation; Q factor; Radio frequency; SAW filters; System-on-a-chip; Testing; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1998. Digest of Technical Papers. 1998 IEEE International
Conference_Location :
San Francisco, CA, USA
ISSN :
0193-6530
Print_ISBN :
0-7803-4344-1
Type :
conf
DOI :
10.1109/ISSCC.1998.672442
Filename :
672442
Link To Document :
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