• DocumentCode
    3082845
  • Title

    Reliable process control with a supervisory expert system

  • Author

    Cinar, A. ; Basila, M.R., Jr.

  • Author_Institution
    Dept. of Chem. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    1990
  • fDate
    5-7 Dec 1990
  • Firstpage
    1543
  • Abstract
    An expert supervisory control system with object-based knowledge representation and rule-based reasoning has been developed such that its general process and control system knowledge forms a core knowledge base which can be used as primitives for rapid prototyping of intelligent control systems for various chemical processes. The expert system assesses process behavior checks for process faults and provides information to the control system for improved process control. An application prototype of the expert system has been developed for retuning of model-based controllers to improve the controlled behavior of a packed-bed chemical reactor system. Specific functions of the MOBECS (model-object-based expert control system) prototype include process fault diagnosis control system performance monitoring and troubleshooting, controller tuning, and control system restructuring
  • Keywords
    chemical technology; expert systems; inference mechanisms; knowledge representation; process computer control; MOBECS; behavior checks; chemical processes; control system restructuring; expert supervisory control system; intelligent control systems; model-based; model-object-based expert control system; object-based knowledge representation; packed-bed chemical reactor system; performance monitoring; process fault diagnosis; process faults; retuning; rule-based reasoning; troubleshooting; Chemical processes; Control system synthesis; Control systems; Diagnostic expert systems; Expert systems; Intelligent control; Knowledge representation; Process control; Prototypes; Supervisory control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1990., Proceedings of the 29th IEEE Conference on
  • Conference_Location
    Honolulu, HI
  • Type

    conf

  • DOI
    10.1109/CDC.1990.203871
  • Filename
    203871