DocumentCode
3082858
Title
Redressing timing issues for speed-independent circuits in deep submicron age
Author
Li, Yu ; Mak, Terrence ; Yakovlev, Alex
Author_Institution
Sch. of EECE, Newcastle Univ., Newcastle-upon-Tyne, UK
fYear
2011
fDate
14-18 March 2011
Firstpage
1
Lastpage
6
Abstract
The class of speed independent (SI) circuits opens a promising way towards tolerating process variations. However, the fundamental assumption of speed independent circuit is that forks in some wires (usually, large percentage of wires) in such circuits are isochronic; this assumption is more and more challenged by the shrinking technology. This paper suggests a method to generate the weakest timing constraints for a SI circuit to work correctly under bounded delays in wires. The method works for all SI circuits and the generated timing constraints are significantly weaker than those suggested in the current literature claiming the weakest formally proved conditions.
Keywords
delay circuits; timing circuits; wires (electric); bounded delays; circuit wires; deep submicron age; isochronic circuit; shrinking technology; speed independent circuit; speed-independent circuits; timing constraints; tolerating process variations; Delay; Hazards; Integrated circuit modeling; Logic gates; Silicon; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location
Grenoble
ISSN
1530-1591
Print_ISBN
978-1-61284-208-0
Type
conf
DOI
10.1109/DATE.2011.5763222
Filename
5763222
Link To Document