• DocumentCode
    3082858
  • Title

    Redressing timing issues for speed-independent circuits in deep submicron age

  • Author

    Li, Yu ; Mak, Terrence ; Yakovlev, Alex

  • Author_Institution
    Sch. of EECE, Newcastle Univ., Newcastle-upon-Tyne, UK
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The class of speed independent (SI) circuits opens a promising way towards tolerating process variations. However, the fundamental assumption of speed independent circuit is that forks in some wires (usually, large percentage of wires) in such circuits are isochronic; this assumption is more and more challenged by the shrinking technology. This paper suggests a method to generate the weakest timing constraints for a SI circuit to work correctly under bounded delays in wires. The method works for all SI circuits and the generated timing constraints are significantly weaker than those suggested in the current literature claiming the weakest formally proved conditions.
  • Keywords
    delay circuits; timing circuits; wires (electric); bounded delays; circuit wires; deep submicron age; isochronic circuit; shrinking technology; speed independent circuit; speed-independent circuits; timing constraints; tolerating process variations; Delay; Hazards; Integrated circuit modeling; Logic gates; Silicon; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763222
  • Filename
    5763222