DocumentCode :
3082858
Title :
Redressing timing issues for speed-independent circuits in deep submicron age
Author :
Li, Yu ; Mak, Terrence ; Yakovlev, Alex
Author_Institution :
Sch. of EECE, Newcastle Univ., Newcastle-upon-Tyne, UK
fYear :
2011
fDate :
14-18 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
The class of speed independent (SI) circuits opens a promising way towards tolerating process variations. However, the fundamental assumption of speed independent circuit is that forks in some wires (usually, large percentage of wires) in such circuits are isochronic; this assumption is more and more challenged by the shrinking technology. This paper suggests a method to generate the weakest timing constraints for a SI circuit to work correctly under bounded delays in wires. The method works for all SI circuits and the generated timing constraints are significantly weaker than those suggested in the current literature claiming the weakest formally proved conditions.
Keywords :
delay circuits; timing circuits; wires (electric); bounded delays; circuit wires; deep submicron age; isochronic circuit; shrinking technology; speed independent circuit; speed-independent circuits; timing constraints; tolerating process variations; Delay; Hazards; Integrated circuit modeling; Logic gates; Silicon; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
ISSN :
1530-1591
Print_ISBN :
978-1-61284-208-0
Type :
conf
DOI :
10.1109/DATE.2011.5763222
Filename :
5763222
Link To Document :
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