Title :
Measurement of surface orientations of transparent objects using polarization in highlight
Author :
Saito, Megumi ; Sato, Yoichi ; Ikeuchi, Katsushi ; Kashiwagi, Hiroshi
Author_Institution :
Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
Abstract :
This paper proposes a method for obtaining surface orientations of transparent objects using polarization in highlight. Since the highlight, the specular component of reflection light from objects, is observed only near the specular direction, it appears merely on limited parts on an object surface. In order to obtain orientations of a whole object surface, we employ a spherical extended light source. This paper reports its experimental apparatus, a shape recovery algorithm, and its performance evaluation
Keywords :
computer vision; image sequences; performance evaluation; polarization; reflection light; shape recovery algorithm; surface orientations measurement; transparent objects; Brightness; Computer vision; Light sources; Optical interferometry; Optical polarization; Optical reflection; Pattern analysis; Shape measurement; Solids; Surface topography;
Conference_Titel :
Computer Vision and Pattern Recognition, 1999. IEEE Computer Society Conference on.
Conference_Location :
Fort Collins, CO
Print_ISBN :
0-7695-0149-4
DOI :
10.1109/CVPR.1999.786967
