DocumentCode
3082999
Title
Effect of EBG structure and ferrite film on power/ground layers for performance maintenance and noise suppression in wireless communication
Author
Ishimura, Kenta ; Toyota, Yoshitaka ; Iokibe, Kengo ; Kondo, K. ; Yoshida, Sigeru
Author_Institution
Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Okayama, Japan
fYear
2013
fDate
12-15 Dec. 2013
Firstpage
217
Lastpage
220
Abstract
Noise suppression and power integrity are two requirements for power/ground layers of printed circuit boards. To accomplish the requirements, we proposed the application of electromagnetic bandgap (EBG) structure and ferrite film to power/ground layers. To evaluate the proposed EBG structure, we have so far measured the electric characteristics of both driving-point impedance and transmission coefficient. Although these evaluation indices are helpful, the evaluation using an actual device is also indispensable. In this paper, we evaluated the suppression of noise propagation through power bus by the proposed EBG structure in wireless communication module. The proposed structure provided sufficient result of the effective maintenance of communication quality by suppressing the propagation of electromagnetic noise.
Keywords
ferrites; interference suppression; maintenance engineering; photonic band gap; printed circuits; radiocommunication; EBG structure effect; driving-point impedance; electric characteristics; electromagnetic bandgap; electromagnetic noise propagation suppression; ferrite film; noise suppression; performance maintenance; power bus; power integrity; power-ground layers; printed circuit boards; transmission coefficient; wireless communication module; Ferrite films; Metamaterials; Noise; Periodic structures; Ports (Computers); Radio frequency; Wireless communication; actual device; electromagnetic bandgap (EBG); ferrite film; noise suppression; performance maintenance; wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
Conference_Location
Nara
Print_ISBN
978-1-4799-2313-7
Type
conf
DOI
10.1109/EDAPS.2013.6724428
Filename
6724428
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