Reliability-driven don´t care assignment for logic synthesis

This paper describes two algorithms for the selective assignment of input don´t cares (DCs) for logical derating of input errors to enhance reliability. It is motivated by the observation that reliability-driven assignment of DCs can improve input error resilience by up to 49.7% in logic circuits. Two algorithms - ranking-based and complexity-factor-based - for reliability-driven DC assignment are proposed in this paper. Both algorithms use Hamming distance metrics to determine 0/1 assignments for the most critical DC terms, thereby leaving flexibility in the circuit specification for subsequent optimization. Since ranking-based DC assignment offers less control over overhead, we develop a complexity-factor-based DC assignment algorithm that can achieve up to 21.4% improvement in error rate with a simultaneous 4.3% reduction in area over conventional DC assignment. Finally, we derive analytical estimates on min-max reliability improvements to evaluate the effectiveness of the proposed algorithms.