Title :
A new circuit simplification method for error tolerant applications
Author :
Shin, Doochul ; Gupta, Sandeep K.
Author_Institution :
Electr. Eng. Dept., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
Starting from a functional description or a gate level circuit, the goal of the multi-level logic optimization is to obtain a version of the circuit that implements the original function at a lower cost. For error tolerant applications - images, video, audio, graphics, and games - it is known that errors at the outputs are tolerable provided that their severities are within application-specified thresholds. In this paper, we perform application level analysis to show that significant errors at the circuit level are tolerable. Then we develop a multi-level logic synthesis algorithm for error tolerant applications that minimizes the cost of the circuit by exploiting the budget for approximations provided by error tolerance. We use circuit area as the cost metric and use a test generation algorithm to select faults that introduce errors of low severities but provide significant area reductions. Selected faults are injected to simplify the circuit for the experiments. Results show that our approach provides significant reductions in circuit area even for modest error tolerance budgets.
Keywords :
fault tolerance; network synthesis; optimisation; circuit simplification method; error tolerance; gate level circuit; multilevel logic optimization; multilevel logic synthesis algorithm; test generation algorithm; Adders; Circuit faults; Computer architecture; Discrete cosine transforms; Erbium; Logic gates; Measurement; ATPG; DCT; Error tolerance; circuit optimization; redundancy removal;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
Print_ISBN :
978-1-61284-208-0
DOI :
10.1109/DATE.2011.5763248