DocumentCode
3083367
Title
A new circuit simplification method for error tolerant applications
Author
Shin, Doochul ; Gupta, Sandeep K.
Author_Institution
Electr. Eng. Dept., Univ. of Southern California, Los Angeles, CA, USA
fYear
2011
fDate
14-18 March 2011
Firstpage
1
Lastpage
6
Abstract
Starting from a functional description or a gate level circuit, the goal of the multi-level logic optimization is to obtain a version of the circuit that implements the original function at a lower cost. For error tolerant applications - images, video, audio, graphics, and games - it is known that errors at the outputs are tolerable provided that their severities are within application-specified thresholds. In this paper, we perform application level analysis to show that significant errors at the circuit level are tolerable. Then we develop a multi-level logic synthesis algorithm for error tolerant applications that minimizes the cost of the circuit by exploiting the budget for approximations provided by error tolerance. We use circuit area as the cost metric and use a test generation algorithm to select faults that introduce errors of low severities but provide significant area reductions. Selected faults are injected to simplify the circuit for the experiments. Results show that our approach provides significant reductions in circuit area even for modest error tolerance budgets.
Keywords
fault tolerance; network synthesis; optimisation; circuit simplification method; error tolerance; gate level circuit; multilevel logic optimization; multilevel logic synthesis algorithm; test generation algorithm; Adders; Circuit faults; Computer architecture; Discrete cosine transforms; Erbium; Logic gates; Measurement; ATPG; DCT; Error tolerance; circuit optimization; redundancy removal;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location
Grenoble
ISSN
1530-1591
Print_ISBN
978-1-61284-208-0
Type
conf
DOI
10.1109/DATE.2011.5763248
Filename
5763248
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