• DocumentCode
    3083367
  • Title

    A new circuit simplification method for error tolerant applications

  • Author

    Shin, Doochul ; Gupta, Sandeep K.

  • Author_Institution
    Electr. Eng. Dept., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Starting from a functional description or a gate level circuit, the goal of the multi-level logic optimization is to obtain a version of the circuit that implements the original function at a lower cost. For error tolerant applications - images, video, audio, graphics, and games - it is known that errors at the outputs are tolerable provided that their severities are within application-specified thresholds. In this paper, we perform application level analysis to show that significant errors at the circuit level are tolerable. Then we develop a multi-level logic synthesis algorithm for error tolerant applications that minimizes the cost of the circuit by exploiting the budget for approximations provided by error tolerance. We use circuit area as the cost metric and use a test generation algorithm to select faults that introduce errors of low severities but provide significant area reductions. Selected faults are injected to simplify the circuit for the experiments. Results show that our approach provides significant reductions in circuit area even for modest error tolerance budgets.
  • Keywords
    fault tolerance; network synthesis; optimisation; circuit simplification method; error tolerance; gate level circuit; multilevel logic optimization; multilevel logic synthesis algorithm; test generation algorithm; Adders; Circuit faults; Computer architecture; Discrete cosine transforms; Erbium; Logic gates; Measurement; ATPG; DCT; Error tolerance; circuit optimization; redundancy removal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763248
  • Filename
    5763248