• DocumentCode
    3083391
  • Title

    Development of SiC power module for high-speed switching operation

  • Author

    Sato, Hikaru ; Kato, Fumiki ; Nakagawa, Hirotoshi ; Yamaguchi, Hitoshi ; Rejeki, Simanjorang ; Lang, Fengkai

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
  • fYear
    2013
  • fDate
    12-15 Dec. 2013
  • Firstpage
    13
  • Lastpage
    16
  • Abstract
    In this work, SiC power module with sandwich structure is fabricated for high-speed switching operation at high temperature. A module structure of SiC power devices are sandwiched between two silicon nitride-active metal brazed copper circuit boards. To make a precise position and height control of the chip bonding, the top side (gate/source or anode pad side) of SiC power devices are flip-chip bonded to circuit electrodes using sub-micron Au particle with low temperature (250°C) and pressure-less sintering. The accuracy of the bonding position of chips was less than 10 μm and the accuracy of the height after bonding chips was less than 15 μm. The flip-chip bonding of SiC-JFET is successfully realized on the substrate without short or open failure electrically. Finally we joint the backside of the SiC-JFET (drain side) and the SiC-SBD (cathode side) to each circuit electrodes at once by means of reflow process with Au-12%Ge solder. Since the sandwitch module showed no fatigue afetr 500 times thermal cycle test between -40°C and 250°C and showed properly operation. The circuit operation of the module is confirmed by a double pulse-switching test.
  • Keywords
    bonding processes; field effect transistor switches; flip-chip devices; power semiconductor switches; silicon; sintering; wide band gap semiconductors; Au; JFET; SiC; active metal brazed copper circuit board; bonding position; double pulse switching test; flip chip bonding; height control; high speed switching operation; position control; power device; power module; pressureless sintering; sandwich structure; submicron particle; temperature -40 C to 250 C; Bonding; Electrodes; Gold; Inductance; Multichip modules; Silicon carbide; Substrates; SiC power devices; flip-chip bond; sandwitch structure; sub-micron Au paste;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
  • Conference_Location
    Nara
  • Print_ISBN
    978-1-4799-2313-7
  • Type

    conf

  • DOI
    10.1109/EDAPS.2013.6724445
  • Filename
    6724445