• DocumentCode
    3083395
  • Title

    A statistical approach to quantifying the EIRP Spectral Density for SOTM terminals

  • Author

    Ouyang, Feng ; Weerackody, Vijitha

  • Author_Institution
    Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper proposes a statistical approach to off-axis EIRP masks, in order to accommodate satellite communications on the move (SOTM) terminals. A ¿statistical mask¿ provides a reference EIRP Spectral Density (ESD) limitation, which can be exceeded with a specified maximum probability. Statistical masks and their implementation approaches are discussed in detail. Simulations are provided to show that the resulting interference is quantifiable and bounded. The statistical mask provides a sound and practical means in controlling interference. This work provides input to the on-going effort of setting emission standards for SOTM by ITU and military standard bodies.
  • Keywords
    mobile satellite communication; radiofrequency interference; statistical analysis; telecommunication standards; EIRP spectral density; ITU; SOTM terminals; emission standards; military standard; satellite communications on the move terminal; statistical approach; statistical mask; Electrostatic discharge; Electrostatic interference; Frequency; Laboratories; Military satellites; Military standards; Physics; Probability; Satellite communication; Satellite ground stations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Military Communications Conference, 2009. MILCOM 2009. IEEE
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-5238-5
  • Electronic_ISBN
    978-1-4244-5239-2
  • Type

    conf

  • DOI
    10.1109/MILCOM.2009.5379853
  • Filename
    5379853