Title :
A unified methodology for pre-silicon verification and post-silicon validation
Author :
Adir, Allon ; Copty, Shady ; Landa, Shimon ; Nahir, Amir ; Shurek, Gil ; Ziv, Avi ; Meissner, Charles ; Schumann, John
Author_Institution :
IBM Res., Haifa, Israel
Abstract :
The growing importance of post-silicon validation in ensuring functional correctness of high-end designs increases the need for synergy between the pre-silicon verification and post-silicon validation. We propose a unified functional verification methodology for the pre- and post-silicon domains. This methodology is based on a common verification plan and similar languages for test-templates and coverage models. Implementation of the methodology requires a user-directable stimuli generation tool for the post-silicon domain. We analyze the requirements for such a tool and the differences between it and its pre-silicon counterpart. Based on these requirements, we implemented a tool called Threadmill and used it in the verification of the IBM POWER7 processor chip with encouraging results.
Keywords :
integrated circuit design; microprocessor chips; monolithic integrated circuits; IBM POWER7 processor chip; high-end designs; postsilicon validation; presilicon verification; threadmill; unified functional verification methodology; user-directable stimuli generation tool; Acceleration; Computer bugs; Generators; Instruction sets; Load modeling; Silicon;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
Print_ISBN :
978-1-61284-208-0
DOI :
10.1109/DATE.2011.5763252