• DocumentCode
    3083549
  • Title

    A generalized subspace approach for estimating visual evoked potentials

  • Author

    Kamel, Nidal ; Yusoff, Mohd Zuki

  • Author_Institution
    Electrical and Electronic Engineering Department, Universiti Teknologi Petronas, 31750 Tronoh, Perak, Malaysia
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    5208
  • Lastpage
    5211
  • Abstract
    A “single-trial” signal subspace approach for extracting visual evoked potential (VEP) from the ongoing “colored” electroencephalogram (EEG) noise is proposed. The algorithm applies the generalized eigendecomposition on the covariance matrices of the VEP and noise to transform them jointly into diagonal matrices in order to avoid a pre-whitening stage. The proposed generalized subspace approach (GSA) decomposes the corrupted VEP space into a signal subspace and noise subspace. Enhancement is achieved by removing the noise subspace and estimating the clean VEPs only from the signal subspace. The validity and effectiveness of the proposed GSA scheme in estimating the latencies of P100´s (used in objective assessment of visual pathways) are evaluated using real data collected from Selayang Hospital in Kuala Lumpur. The performance of GSA is compared with the recently proposed single-trial technique called the Third Order Correlation (TOC).
  • Keywords
    Colored noise; Covariance matrix; Data mining; Degradation; Delay; Electroencephalography; Hospitals; Matrix decomposition; Signal to noise ratio; Testing; Visual evoked potentials; generalized eigenvalue decomposition; higher order statistics; subspace filtering; Algorithms; Diagnosis, Computer-Assisted; Electroencephalography; Event-Related Potentials, P300; Evoked Potentials, Visual; Humans; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Visual Cortex;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4650388
  • Filename
    4650388