• DocumentCode
    3083629
  • Title

    Arithmetic logic units with high error detection rates to counteract fault attacks

  • Author

    Medwed, Marcel ; Mangard, Stefan

  • Author_Institution
    IAIK, Graz Univ. of Technol., Graz, Austria
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Modern security-aware embedded systems need protection against fault attacks. These attacks rely on intentionally induced faults. Such intentional faults have not only a different origin, but also a different nature than errors that fault-tolerant systems usually have to face. For instance an adversary who attacks the circuit with two lasers can potentially induce two errors at different positions. Such errors can not only defeat simple double modular redundancy schemes, but as we show, also naive schemes based on any linear code over GF(2). In this article, we describe arithmetic logic units (ALUs) which provide high error detection rates even in the presence of such errors. The contribution in this article is threefold. First, we show that the minimum weight of an undetected error is no longer defined by the code distance when certain arithmetic and logic operations are applied to the codewords. As a result, additional hardware is needed to preserve the minimum error weight for a given code. Second, we show that for multi-residue codes, these delicate operations are rare in typical smart card applications. This allows for an efficient time-area trade-off for checking the codewords and thus to significantly reduce the hardware costs for such a protected ALU. Third, we implement the proposed architectures and study the influence of the register file and a multiplier on the area and on the critical path.
  • Keywords
    arithmetic codes; cryptography; error detection; linear codes; arithmetic logic units; fault attacks; high error detection rates; linear code; security-aware embedded systems; Adders; Computer architecture; Delay; Hardware; Linear code; Redundancy; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763261
  • Filename
    5763261