• DocumentCode
    3083656
  • Title

    Sustainability through massively integrated computing: Are we ready to break the energy efficiency wall for single-chip platforms?

  • Author

    Pande, Partha ; Clermidy, Fabien ; Puschini, Diego ; Mansouri, Imen ; Bogdan, Paul ; Marculescu, Radu ; Ganguly, Amlan

  • Author_Institution
    Sch. of EECS, Washington State Univ., Pullman, WA, USA
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    While traditional cluster computers are more constrained by power and cooling costs for solving extreme-scale (or exascale) problems, the continuing progress and integration levels in silicon technologies make possible complete end-user systems on a single chip. This massive level of integration makes modern multicore chips all pervasive in domains ranging from climate forecasting and astronomical data analysis, to consumer electronics, smart phones, and biological applications. Consequently, designing multicore chips for exascale computing while using the embedded systems design principles looks like a promising alternative to traditional cluster-based solutions. This paper aims to present an overview of new, far-reaching design methodologies and run-time optimization techniques that can help breaking the energy efficiency wall in massively integrated single-chip computing platforms.
  • Keywords
    embedded systems; microprocessor chips; system-on-chip; workstation clusters; astronomical data analysis; climate forecasting; cluster computers; cluster-based solutions; embedded systems; end-user systems; exascale computing; extreme-scale problems; multicore chips; silicon technologies; single-chip platforms; sustainability; Energy efficiency; Game theory; Multicore processing; Optimization; Power demand; System-on-a-chip; Wireless communication; Exascale computing; consensus theory; fractal behavior; game theory; multicore; small-world;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763263
  • Filename
    5763263