Title :
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool
Author :
Faurax, Olivier ; Tria, Assia ; Freund, Laurent ; Bancel, Frédéric
Author_Institution :
Ecole des Mines de St Etienne, Gardanne
Abstract :
Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a methodology and a tool to analyse the robustness of circuit under faults induced by a delay. We tested a circuit implementing AES and showed that delay faults can permit to perform known fault attacks.
Keywords :
cryptography; fault diagnosis; stability; AES; PAFI tool; circuit robustness; circuits under delay-induced faults; cryptanalysis; cryptographic circuits; differential fault analysis; fault attacks; prototype of another fault injector; Circuit faults; Circuit testing; Communication industry; Cryptography; Information security; Latches; Mining industry; Propagation delay; Prototypes; Robustness;
Conference_Titel :
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location :
Crete
Print_ISBN :
0-7695-2918-6
DOI :
10.1109/IOLTS.2007.57
