• DocumentCode
    3083815
  • Title

    Realization and SEM observation of polysilicon and aluminium cantilever using surface micromachining technology

  • Author

    Lucas, S. ; Outaleb, N. ; Bonnaud, O. ; Pinel, J.

  • Author_Institution
    Groupe de Microelectron. et Visualisation, Rennes I Univ., France
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    28
  • Lastpage
    29
  • Abstract
    This tutorial concerns graduate electronic engineering students, either in DESS, DEA or engineer formations. The aim of this training is to allow them to apply their knowledge of microelectronics lectures to surface micromachining technology. In this work, students fabricate a polysilicon and an aluminium cantilever beam by using the usual technological process steps in a cleanroom. The process is based on the stripping of an underlying sacrificial layer. At the end of the fabrication process, a scanning electron microscopy observation is performed
  • Keywords
    clean rooms; electronic engineering education; integrated circuits; micromachining; scanning electron microscopy; student experiments; surface treatment; training; Al; Si; aluminium; cantilever beam fabrication; cleanroom; fabrication process; graduate electronic engineering students; microelectronics lectures; polysilicon; sacrificial layer stripping; scanning electron microscopy observation; surface micromachining technology; technological process steps; Aluminum; Annealing; Chemical technology; Fabrication; Lithography; Micromachining; Silicon; Sputter etching; Sputtering; Structural beams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Systems Education, 1999. MSE'99. IEEE International Conference on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7695-0312-8
  • Type

    conf

  • DOI
    10.1109/MSE.1999.787021
  • Filename
    787021