DocumentCode
3083815
Title
Realization and SEM observation of polysilicon and aluminium cantilever using surface micromachining technology
Author
Lucas, S. ; Outaleb, N. ; Bonnaud, O. ; Pinel, J.
Author_Institution
Groupe de Microelectron. et Visualisation, Rennes I Univ., France
fYear
1999
fDate
1999
Firstpage
28
Lastpage
29
Abstract
This tutorial concerns graduate electronic engineering students, either in DESS, DEA or engineer formations. The aim of this training is to allow them to apply their knowledge of microelectronics lectures to surface micromachining technology. In this work, students fabricate a polysilicon and an aluminium cantilever beam by using the usual technological process steps in a cleanroom. The process is based on the stripping of an underlying sacrificial layer. At the end of the fabrication process, a scanning electron microscopy observation is performed
Keywords
clean rooms; electronic engineering education; integrated circuits; micromachining; scanning electron microscopy; student experiments; surface treatment; training; Al; Si; aluminium; cantilever beam fabrication; cleanroom; fabrication process; graduate electronic engineering students; microelectronics lectures; polysilicon; sacrificial layer stripping; scanning electron microscopy observation; surface micromachining technology; technological process steps; Aluminum; Annealing; Chemical technology; Fabrication; Lithography; Micromachining; Silicon; Sputter etching; Sputtering; Structural beams;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Systems Education, 1999. MSE'99. IEEE International Conference on
Conference_Location
Arlington, VA
Print_ISBN
0-7695-0312-8
Type
conf
DOI
10.1109/MSE.1999.787021
Filename
787021
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