Title :
Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test set
Author :
Mathew, J. ; Rahaman, H. ; Pradhan, D.K.
Author_Institution :
Univ. of Bristol, Bristol
Abstract :
We present a C-testable method for detecting stuck-at (s-a) faults in the polynomial basis (PB) bit parallel multiplier circuits over GF(2m). It requires only 7 tests for detecting faults to provide 100% fault coverage, which is independent of the multiplier size. These 7 tests can be derived directly without any requirement of ATPG tools. Synopsysreg tool is used to generate ATPG based test patterns.
Keywords :
Galois fields; automatic test pattern generation; multiplying circuits; Bit Parallel Multipliers; C-testable method; GF(2m); Synopsys tool; TPG based test patterns; stuck-at faults; Automatic test pattern generation; Circuit faults; Circuit testing; Computer science; Electrical fault detection; Fault detection; Galois fields; Polynomials; Test pattern generators; Very large scale integration;
Conference_Titel :
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location :
Crete
Print_ISBN :
0-7695-2918-6
DOI :
10.1109/IOLTS.2007.28
