DocumentCode
3084134
Title
Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips
Author
Collet, Jacques Henri ; Zajac, Piotr
Author_Institution
LAAS-CNRS, Toulouse
fYear
2007
fDate
8-11 July 2007
Firstpage
259
Lastpage
259
Abstract
We describe a self-configuration methodology to tolerate defective nodes in chips organized in massively replicative architectures as those shown below in Figure 1, made up of hundreds of cores in a highly defective technology. Note that the keyword of this presentation is not configuration but self-configuration. The basic idea is that chips will become so complex that it will be unrealistic to consider diagnosing all nodes and all routes with some external equipment. Contrarily, chips should become autonomous and adaptative to preserve their resilience, and as little external interventions as possible should be involved to control the start up phase and the subsequent operation. By self-configuration we mean self-diagnosis of cores through mutual tests (both at startup and possibly at runtime), self-configuration of communications, self-shutdown of the cores which cannot take part to the processing, and ultimately, adaptative task allocation and redundant execution at runtime to cope with transient faults.
Keywords
nanoelectronics; system-on-chip; massively defective nanochips; massively replicative architectures; production yield; resilience; self configuration methodology; Automatic testing; Communication system control; Computer architecture; Computer science; Mechanical factors; Microelectronics; Production; Resilience; Runtime; Samarium;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location
Crete
Print_ISBN
0-7695-2918-6
Type
conf
DOI
10.1109/IOLTS.2007.56
Filename
4274862
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