• DocumentCode
    3084134
  • Title

    Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips

  • Author

    Collet, Jacques Henri ; Zajac, Piotr

  • Author_Institution
    LAAS-CNRS, Toulouse
  • fYear
    2007
  • fDate
    8-11 July 2007
  • Firstpage
    259
  • Lastpage
    259
  • Abstract
    We describe a self-configuration methodology to tolerate defective nodes in chips organized in massively replicative architectures as those shown below in Figure 1, made up of hundreds of cores in a highly defective technology. Note that the keyword of this presentation is not configuration but self-configuration. The basic idea is that chips will become so complex that it will be unrealistic to consider diagnosing all nodes and all routes with some external equipment. Contrarily, chips should become autonomous and adaptative to preserve their resilience, and as little external interventions as possible should be involved to control the start up phase and the subsequent operation. By self-configuration we mean self-diagnosis of cores through mutual tests (both at startup and possibly at runtime), self-configuration of communications, self-shutdown of the cores which cannot take part to the processing, and ultimately, adaptative task allocation and redundant execution at runtime to cope with transient faults.
  • Keywords
    nanoelectronics; system-on-chip; massively defective nanochips; massively replicative architectures; production yield; resilience; self configuration methodology; Automatic testing; Communication system control; Computer architecture; Computer science; Mechanical factors; Microelectronics; Production; Resilience; Runtime; Samarium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
  • Conference_Location
    Crete
  • Print_ISBN
    0-7695-2918-6
  • Type

    conf

  • DOI
    10.1109/IOLTS.2007.56
  • Filename
    4274862