DocumentCode :
3084209
Title :
Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters
Author :
Tarnick, Steffen
Author_Institution :
4TECH GmbH, Teltow
fYear :
2007
fDate :
8-11 July 2007
Firstpage :
285
Lastpage :
292
Abstract :
Self-testing m-out-of-n code checkers are often designed using parallel counters. Each code word is partitioned into two parts. The ones of both parts are counted by two parallel counters or similar circuits and the obtained numbers, after a correction if necessary, are evaluated using another checker. In this paper this checker design method is extended such that the obtained checkers achieve the self-testing property under very weak conditions. It is only required that no checker input gets a constant signal and that the code words occur in a random order so that the checkers can be used as embedded checkers. The basic building blocks of the checkers are two identical parallel counters that only consist of full adders of which some have a special architecture. The obtained checkers have in most cases a much smaller hardware size than previously known embedded m-out-of-n code checkers. The proposed design method that works for all m-out-of-n codes is further extended to make the checkers programmable, i.e. the same m-out-of-n code checker can be used for different values of m.
Keywords :
automatic testing; programmable logic devices; complete parallel counters; embedded checkers; embedded m-out-of-n code checkers; Adders; Automatic testing; Built-in self-test; Circuit faults; Counting circuits; Design methodology; Hardware; Random sequences; System testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location :
Crete
Print_ISBN :
0-7695-2918-6
Type :
conf
DOI :
10.1109/IOLTS.2007.27
Filename :
4274868
Link To Document :
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