• DocumentCode
    3084248
  • Title

    Architectural exploration of 3D FPGAs towards a better balance between area and delay

  • Author

    Chen, Chia-I ; Lee, Bau-Cheng ; Huang, Juinn-Dar

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The emerging 3D technology, which stacks multiple dies within a single chip and utilizes through-silicon vias (TSVs) as vertical connections, is considered a promising solution for achieving better performance and easy integration. Similarly, a generic 2D FPGA architecture can evolve into a 3D one by extending its signal switching scheme from 2D to 3D by means of TSVs. However, replacing all 2D switch boxes (SBs) by 3D ones with full vertical connectivity is found both area-consuming and resource-squandering. Therefore, it is possible to greatly reduce the footprint with only minor delay increase by properly tailoring the structure and deployment strategy of 3D SB. In this paper, we perform a comprehensive architectural exploration of 3D FPGAs. Various architectural alternatives are proposed and then evaluated thoroughly to pick out the most appropriate ones with a better balance between area and delay. Finally, we recommend several configurations for generic 3D FPGA architectures, which can save up to 52% area with virtually no delay penalty.
  • Keywords
    field programmable gate arrays; three-dimensional integrated circuits; 2D FPGA architecture; 3D FPGA; full vertical connectivity; signal switching scheme; through-silicon vias; vertical connection; Computer architecture; Delay; Field programmable gate arrays; Routing; Three dimensional displays; Through-silicon vias; Tiles; 3D FPGAs; 3D ICs; architectural expiation; area/delay trade-off;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763290
  • Filename
    5763290