DocumentCode :
3084478
Title :
Transition-Time-Relation based capture-safety checking for at-speed scan test generation
Author :
Miyase, K. ; Wen, X. ; Aso, M. ; Furukawa, H. ; Yamato, Y. ; Kajihara, S.
Author_Institution :
Kyushu Inst. of Technol., Kitakyushu, Japan
fYear :
2011
fDate :
14-18 March 2011
Firstpage :
1
Lastpage :
4
Abstract :
Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. This paper presents a novel metric, called the TTR (Transition-Time-Relation-based) metric, which takes transition time relations into consideration in capture-safety checking. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
Keywords :
automatic test pattern generation; boundary scan testing; failure analysis; TTR metric; at-speed scan test generation; at-speed scan testing; capture-safety checking mandatory; low-capture-power test generation; novel metric; test vector sign-off; test vectors; test-induced yield loss; timing failures; transition-time-relation based capture-safety checking; transition-time-relation-based metric; Accuracy; Delay; Logic gates; Power supplies; Switches; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
ISSN :
1530-1591
Print_ISBN :
978-1-61284-208-0
Type :
conf
DOI :
10.1109/DATE.2011.5763300
Filename :
5763300
Link To Document :
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