• DocumentCode
    3084478
  • Title

    Transition-Time-Relation based capture-safety checking for at-speed scan test generation

  • Author

    Miyase, K. ; Wen, X. ; Aso, M. ; Furukawa, H. ; Yamato, Y. ; Kajihara, S.

  • Author_Institution
    Kyushu Inst. of Technol., Kitakyushu, Japan
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. This paper presents a novel metric, called the TTR (Transition-Time-Relation-based) metric, which takes transition time relations into consideration in capture-safety checking. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
  • Keywords
    automatic test pattern generation; boundary scan testing; failure analysis; TTR metric; at-speed scan test generation; at-speed scan testing; capture-safety checking mandatory; low-capture-power test generation; novel metric; test vector sign-off; test vectors; test-induced yield loss; timing failures; transition-time-relation based capture-safety checking; transition-time-relation-based metric; Accuracy; Delay; Logic gates; Power supplies; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763300
  • Filename
    5763300