Title :
Investigation On Tape/head Contact In Vtr
Author :
Okuwaki, T. ; Kawakita, T. ; Akahane, N. ; Kusumoto, K.
Author_Institution :
Hitachi Maxell, Ltd., Oyamazaki, Otokuni, Kyoto 618, Japan
Keywords :
Cameras; Glass; Image resolution; Magnetic heads; Measurement errors; Optical interferometry; Rough surfaces; Silicon; Surface roughness; Video recording;
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
DOI :
10.1109/INTMAG.1993.642104