• DocumentCode
    3084573
  • Title

    Nonlinear regression for sub-peak detection of intracranial pressure signals

  • Author

    Scalzo, Fabien ; Xu, Peng ; Bergsneider, Marvin ; Hu, Xiao

  • Author_Institution
    Division of Neurosurgery, Geffen School of Medicine, University of California, Los Angeles, USA
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    5411
  • Lastpage
    5414
  • Abstract
    The management of many neurological disorders such as traumatic brain injuries relies on the continuous measurement of intracranial pressure (ICP). Following recent studies, the automatic analysis of ICP pulse seems to be a promising tool for forecasting intracranial and cerebrovascular pathophysiological changes. MOCAIP algorithm has recently been developed to automatically extract ICP morphological features in real time. The algorithm is capable of enhancing ICP signal quality, recognizing legitimate ICP pulses, and designating the three peaks in an ICP pulse. This paper extends MOCAIP by using a regression model instead of Gaussian priors during the peak designation to improve the accuracy of the process. The experimental evaluations of the proposed algorithm are performed on a ICP signal database built from 700 hours of recordings from 66 neurosurgical patients. They indicate that the use of a regression model significantly increases the peak designation accuracy.
  • Keywords
    Algorithm design and analysis; Brain injuries; Cranial pressure; Databases; Feature extraction; Iterative closest point algorithm; Neurosurgery; Performance evaluation; Pressure measurement; Signal design; Algorithms; Data Interpretation, Statistical; Diagnosis, Computer-Assisted; Intracranial Pressure; Manometry; Nonlinear Dynamics; Pattern Recognition, Automated; Regression Analysis; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4650438
  • Filename
    4650438