• DocumentCode
    3084639
  • Title

    jTLM: An experimentation framework for the simulation of transaction-level models of Systems-on-Chip

  • Author

    Funchal, Giovanni ; Moy, Matthieu

  • Author_Institution
    STMicroelectronics, Grenoble, France
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Virtual prototypes are simulators used in the consumer electronics industry. Transaction-level Modeling (TLM) is a widely used technique for designing such virtual prototypes. In particular, they allow for early development of embedded software. The SystemC modeling language is the current industry standard for developing virtual prototypes. Our experience suggests that writing TLM models exclusively in SystemC leads sometimes to confusion between modeling concepts and their implementation, and may be the root of some known bad practices. This paper introduces jTLM, an experimentation framework that allow us to study the extent to which common modeling issues come from a more fundamental constraint of the TLM approach. We focus on a discussion of the two modes of simulation scheduling: cooperative and preemptive. We confront the implications of these two modes on the way of designing TLM models, the software bugs exposed by the simulators and the performance.
  • Keywords
    C++ language; consumer electronics; embedded systems; hardware description languages; program debugging; system-on-chip; virtual prototyping; SystemC modeling language; TLM model; consumer electronics industry; cooperative simulation scheduling; embedded software; preemptive simulation scheduling; software bug; systems-on-chip; transaction-level modeling; virtual prototype; Computer bugs; Hardware; Java; Prototypes; Software; Time domain analysis; Time varying systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763309
  • Filename
    5763309