Title :
a Fast and Multi-function Reliability Test for thin-film Magnetic Recording Components
Author_Institution :
Thin-Film Disk Engineering, IBM New York
Keywords :
Ellipsometry; Lubricants; Magnetic films; Magnetic recording; Sputtering; Testing;
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
DOI :
10.1109/INTMAG.1993.642110
